PEB3065 Ver la hoja de datos (PDF) - Siemens AG
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PEB3065 Datasheet PDF : 102 Pages
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PEB 3065
PEF 3065
SLICOFI® Principles
feeding switches automatically and smooth to the resistive branch (Rin > 0-1 k). For
superposing voice as well as Teletax pulses the necessary drop at the line can be
calculated and taken into account as well. The outgoing DC-feeding value - superposed
with the AC-Loop result at the summing point is transferred to pin 26 (V2W).
Supervision
The HOOK-information is the most important one and the SLICOFI provides this
information via CIDU (see chapter 5.6), in all operating modes:
For Power Denial via 2 high voltage input pins (VLINE) directly connected to the line.
For each other mode the line current information (from pin IT) is transferred via an ADC
to the DSP where the Offhook information is extracted in the proper way:
Power Down: Offhook is detected if Constant current feeding is possible.
Active:
Offhook is detected if the incoming voltage at IT exceeds a programmed
value. To avoid instable information, lowpass filtering and a hystereses
is provided (2 independent programmable values for Offhook and
Onhook detection).
Ringing:
Ring Trip occurs if the DC-value at IT exceeds the programmed Ring
Trip threshold. The AC-value is filtered by the SLICOFI automatically.
Ring Trip detection is reported within 2 cycles of the ring period and then
the internal ring generator is switched off within 3 cycles at zero crossing
of the ring voltage.
Ground key (CIDU-6: GNK) is reported if the absolute value of the voltage at pin IL
exceeds 255 mV. With a programmable lowpass filter (see chapter 5.6) interfering
frequencies (e.g. power lines with 50/60 Hz) can be filtered very effectively.
3.3
Test Features
The SLICOFI provides two different kinds of test features: Internal test loops for circuit
testing and defined test loops to perform board and line tests. There are loops for testing
AC and DC path. As a special feature it is possible to switch signals to and from the
DC-path via the IOM-2 Interface. Additionally there is the possibility to cut off the
AC-receive and transmit path.
(The different kinds of testmodes are described in chapter 10.3)
Semiconductor Group
14
01.98
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