Philips Semiconductors
Threshold detector and reset generator
Product specification
PCF1252-X family
SYMBOL
PARAMETER
CONDITIONS
MIN.
TYP.
MAX. UNIT
COMIN
VSP
∆VSP
COMIN switch point
Tamb = 25 °C; note 1 1.28
COMIN switch point temperature note 2
−
coefficient
1.30
±0.1
1.32
±0.5
V
mV/K
SELECT
VIL
LOW level input voltage
VIH
HIGH level input voltage
−
−
0.7VDD −
0.3VDD
V
−
V
SELECT and COMIN
ILI
LOW level leakage input current
ILI
HIGH level leakage input current
−
−
−
−
−1.0
µA
1.0
µA
POWF, RESET and COMOUT
IO
output sink current
VO = 0.4 V;
1
3
−
mA
VDD = 2.4 V;
see Fig.6
IO
output source current
VO = 2.0 V;
−0.75 −2
−
mA
VDD = 2.4 V;
see Fig.7
tR
reset time
tS
save time
tR/tS
reset to save time ratio
Cint
CT internal capacitance
CCT = 1 nF; note 3 400
1 000
2 000
µs
CCT = 1 nF; note 3 40
100
200
µs
−
10
−
−
100
−
pF
Notes
1. Long time stability of COMIN switch point VSP and voltage trip point VTRIP: within 10 years of continuous operation
at VDD(max) and an average operating temperature of 55 °C the drift of VSP will not exceed ±10 mV. The maximum
drift for VTRIP will not exceed (±VTRIP(typ)/VSP(typ)) 10 mV.
2. Values given per degree Kelvin; tested on a sample basis.
3. Conformance to these specifications is only guaranteed if the slew rate of VDD is less than 25 V/ms.
1998 Apr 16
5