MX29F400TTC-90 Ver la hoja de datos (PDF) - Macronix International

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componentes Descripción

Fabricante

MX29F400TTC-90

4M-BIT [512Kx8/256Kx16] CMOS FLASH MEMORY

Macronix International 

SWITCHING TEST CIRCUITS

DEVICE UNDER

TEST

MX29F400T/B

CL

1.2K ohm

1.6K ohm

+5V

DIODES=IN3064

OR EQUIVALENT

CL=100pF Including jig capacitance,

CL=50pF for MX29F400T/B-55

SWITCHING TEST WAVEFORMS

2.4V

0.45V

INPUT

2.0V

0.8V

TEST POINTS

2.0V

0.8V

OUTPUT

AC TESTING: Inputs are driven at 2.4V for a logic "1" and 0.45V for a logic "0".

Input pulse rise and fall time are < 20ns.(5ns for MX29F400T/B-55)

Note:VIH/VIL=3.0V/0V, VOH/VOL=1.5V/1.5V, for MX29F400T/B-55.

COMMAND WRITE TIMING WAVEFORM

VCC

5V

Addresses VIH

VIL

WE VIH

VIL

CE VIH

VIL

OE VIH

VIL

VIH

Data

VIL

tAS

tOES

ADD Valid

tAH

tCEP

tCWC

tCS

tCH

tDS

tDH

DIN

tCEPH1

P/N:PM0439

REV. 1.6, NOV. 12, 2001

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