A3195EU Ver la hoja de datos (PDF) - Allegro MicroSystems
Número de pieza
componentes Descripción
Fabricante
A3195EU Datasheet PDF : 10 Pages
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3195
PROTECTED, HIGH-TEMP.,
ACTIVE PULL-DOWN
HALL-EFFECT LATCH
CRITERIA FOR DEVICE QUALIFICATION
All Allegro sensors are subjected to stringent qualification requirements prior to being released to production.
To become qualified, except for the destructive ESD tests, no failures are permitted.
Qualification Test
Biased Humidity
High-Temperature
Operating Life
Surge Operating Life
Pressure Cooker,
Unbiased
Storage Life
Temperature Cycle
ESD
Human Body Model
ESD
Machine Model
Test Method and
Test Conditions
JESD22-A101
TA = 85°C, RH = 85%
JESD22-A108
TA = 150°C, TJ = 165°C
JESD22-A108
TA = 175°C, TJ = 190°C
JESD22-A102, Method C
MIL-STD-883, Method 1008
TA = 170°C
MIL-STD-883, Method 1010
MIL-STD-883, Method 3015
No. of
Lots
3
Test Length
1200 hrs
Samples
Per Lot
116
3
1200 hrs
116
1
504 hrs
116
3
96 hrs
77
1
1200 hrs
77
3
1000 cycles
153
1
Pre/Post
3 per
Reading
test
1
Pre/Post
3 per
Reading
test
Comments
Device biased for
minimum power
Test to failure
HBM ≥ 12 kV
Test to failure
MM ≥ 600 V
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