DatasheetQ Logo
Electronic component search and free download site. Transistors,MosFET ,Diode,Integrated circuits

G084SN05V3 Ver la hoja de datos (PDF) - AU Optronics

Número de pieza
componentes Descripción
Fabricante
G084SN05V3
Auo
AU Optronics  Auo
G084SN05V3 Datasheet PDF : 26 Pages
First Prev 21 22 23 24 25 26
11.0 Reliability test items (Note 1)
Test tem
Test Condition
High temperature storage
60, 240Hrs
Remark
Note 1, 2, 3
Low temperature storage
-20, 240Hrs
Note 1, 2, 3
High temperature & high
humidity operation
40, 90%RH, 240Hrs
(No condensation)
High temperature operation 50, 240Hrs
Note 1, 2, 3
Note 1, 2, 3
Low temperature operation 0, 240Hrs
Note 1, 2, 3
Electrostatic discharge
(non-operation)
150 pF,150Ω,10kV,1 second, 9 position on the
panel, 10 times each place
Note 3
Vibration
(non-operation)
1.5G, 10HZ ~ 200HZ ~ 10HZ
30 minutes for each Axis (X, Y, Z)
Note 1, 2, 3
Mechanical shock
(non-operation)
50G/20ms, ±X, ±Y, ±Z
half-Sin, one time
Note 1, 2, 3
Thermal shock
(non-operation)
1. -20℃±330minutes
60℃±330minutes
2. 100 cycles
3. Temperature transition time within 5
minutes
Note 1, 2, 3
Note 1: Evaluation should be tested after storage at room temperature for one hour.
Note 2: There should be no change which might affect the practical display function when
the display quality test is conducted under normal operating condition.
Note 3: Judgement: 1. Function OK 2. No serious image quality degradation
(C) Copyright AU Optroncis, Inc.
2006 All Right Reserved.
No Reproduction and Redistribution Allowed.
G084SN05 V.3 ver.0.1
22/25

Share Link: 

datasheetq.com  [ Privacy Policy ]Request Datasheet ] [ Contact Us ]