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SP3222EB Ver la hoja de datos (PDF) - Signal Processing Technologies

Número de pieza
componentes Descripción
Fabricante
SP3222EB
Sipex
Signal Processing Technologies Sipex
SP3222EB Datasheet PDF : 20 Pages
First Prev 11 12 13 14 15 16 17 18 19 20
RRCC
DC Power
Source
SSWW11
RRSS
CCSS
SSWW22
Device
Under
Test
Figure 18. ESD Test Circuit for Human Body Model
The Contact Discharge Method applies the ESD
current directly to the EUT. This method was
devised to reduce the unpredictability of the
ESD arc. The discharge current rise time is
constant since the energy is directly transferred
without the air-gap arc. In situations such as
hand held systems, the ESD charge can be
directly discharged to the equipment from a
person already holding the equipment. The
current is transferred on to the keypad or the
serial port of the equipment directly and then
travels through the PCB and finally to the IC.
The circuit models in Figures 18 and 19
represent the typical ESD testing circuits used
for all three methods. The CS is initially charged
with the DC power supply when the first
switch (SW1) is on. Now that the capacitor is
charged, the second switch (SW2) is on while
SW1 switches off. The voltage stored in the
capacitor is then applied through RS, the current
limiting resistor, onto the device under test
(DUT). In ESD tests, the SW2 switch is pulsed
so that the device under test receives a duration
of voltage.
RRCC
DC Power
Source
SSWW11
Contact-Discharge Module
RRSS
RV
SSWW22
CCSS
Device
Under
Test
RS and RV add up to 330for IEC1000-4-2.
Figure 19. ESD Test Circuit for IEC1000-4-2
Rev. A Date:12/11/03
SP3222EB/3232EB True +3.0 to +5.5V RS-232 Transceivers
13
© Copyright 2003 Sipex Corporation

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