MAX785 Ver la hoja de datos (PDF) - Maxim Integrated
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MAX785 Datasheet PDF : 24 Pages
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Product Reliability Report
conclusions and diminishing the integrity of failure-
rate estimates. Uncontrolled processes also make it
difficult to prove failure rates of less than 10 FIT.
Maxim monitors the stability of critical process para-
meters through the use of computerized Statistical
Process Control (SPC). Over 125 charts are moni-
tored in-line during wafer production. Additionally,
over 100 process parameters are monitored at Wafer
Acceptance. Maxim has a target Capability
Coefficient (Cpk) goal of 1.5, which is equivalent to
7ppm. In addition to SPC, Maxim uses Design of
Experiments (DOE) to improve process capability,
optimize process targeting, and increase robustness.
______________________________________________________________________Reliability Test Results
TABLE 5. LIFE TEST AT 135°C/1000 HRS. FOR THE
METAL-GATE CMOS PROCESS (SMG)
DEVICE
TYPE
MAX634
ICM7555
MAX8211
MAX421
MAX232
MAX232
MAX202E
MAX8211
MAX232
MAX850
MAX202E
MAX202E
MAX850
MAX8211
MAX232
MAX211E
MAX211E
MAX8212
MAX232
MAX850
MAX211
MAX844
MAX232
MAX667
MAX654
DATE
CODE
9551
9551
9552
9552
9553
9602
9603
9612
9613
9616
9622
9623
9623
9624
9626
9627
9631
9633
9634
9635
9635
9636
9638
9640
9641
PKG.
8 PDIP
TO99
8 PDIP
14 PDIP
16 PDIP
16 WSO
16 PDIP
8 SO
8 SO
16 PDIP
16 PDIP
16 PDIP
8 SO
8 SO
16 PDIP
28 SSOP
28 SSOP
8 SO
16 PDIP
8 SO
28 SSOP
8 SO
16 PDIP
8 PDIP
14 PDIP
SAMPLE
SIZE
77
77
77
77
74
400
75
77
77
78
80
80
77
77
74
65
80
77
80
80
76
79
77
80
79
FAILURES (HRS)
192 500 1000
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
Totals
2250
0
0
0
Note: Products included in this Life Test data are: A/D Converters, Operational
Amplifiers, Power-Supply Circuits, Interface, and Display Drivers/Counters.
TABLE 6. LIFE TEST AT 135°C/1000 HRS. FOR THE
MEDIUM-VOLTAGE METAL-GATE CMOS PROCESS (MV1)
DEVICE
TYPE
DG201
DG302
MAX359
DG509
DG301
Totals
DATE
CODE
9612
9626
9637
9638
9638
PKG.
16 PDIP
16 PDIP
16 PDIP
16 PDIP
16 PDIP
SAMPLE
SIZE
74
77
80
77
77
385
FAILURES (HRS)
192 500 1000
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
TABLE 7. LIFE TEST AT 135°C/1000 HRS. FOR THE
MEDIUM-VOLTAGE SILICON-GATE CMOS PROCESS (MV2)
DEVICE
TYPE
DG411
MAX305
MAX303
MAX319
MAX303
MAX333
DATE
CODE
9553
9611
9626
9637
9637
9638
PKG.
16 PDIP
16 PDIP
16 PDIP
8 SO
16 PDIP
20 PDIP
SAMPLE
SIZE
77
77
77
79
77
80
FAILURES (HRS)
192 500 1000
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
Totals
467
0
0
0
TABLE 8. LIFE TEST AT 135°C/1000 HRS. FOR THE
3µm SILICON-GATE CMOS PROCESS (SG3)
DEVICE
TYPE
MAX708
MAX706
MXD1210
MAX4501
MAX4502
MAX3222
MAX707
MAX4503
MAX4504
MAX4514
MAX4516
MAX4517
MAX4518
MAX4519
MAX4515
MAX797
MAX785
MAX782
MAX797
MAX705
MAX785
MAX706
Totals
DATE
CODE
9551
9552
9606
9611
9611
9613
9613
9615
9615
9615
9615
9615
9615
9615
9616
9616
9623
9624
9624
9626
9630
9640
PKG.
8 PDIP
8 PDIP
8 PDIP
8 PDIP
8 PDIP
18 PDIP
8 PDIP
8 PDIP
8 PDIP
8 PDIP
8 PDIP
8 PDIP
14 PDIP
14 PDIP
8 PDIP
16 SO
28 SSOP
36 SSOP
16 SO
8 PDIP
28 SSOP
8 PDIP
SAMPLE
SIZE
79
76
79
78
77
80
77
70
70
79
70
50
79
79
80
77
65
65
80
77
38
77
1602
FAILURES (HRS)
192 500 1000
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
Note: Products included in this Life Test data are: Analog Switches and
Analog Multiplexers.
14 _____________________________________________________________________________________
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