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SA9401 Ver la hoja de datos (PDF) - South African Micro Electronic Systems

Número de pieza
componentes Descripción
Fabricante
SA9401
Sames
South African Micro Electronic Systems Sames
SA9401 Datasheet PDF : 16 Pages
First Prev 11 12 13 14 15 16
SA9401
Finally the system designer should calculate the PCM sample value for each of the 240
samples in the block. The PCM values used may of course be calculated according to
either A or µ-law and adjusted to suit the required amplitude.
Up to 16 Tone Blocks may be defined each with a maximum of 511 samples. Tone
Blocks are stored in the EPROM starting at address b * 0200H where b is the number of
the block from 0 to 15 (decimal).
APPLICATION INFORMATION
To simplify the translation of Tone Plan requirements to EPROM data SAMES offer a
Support Software pack. This elegant package will guide the designer through the defi-
nition of Tone Plans and translate the requirements into a hex source file ready for most
commonly used PROM programmers. For more details contact your nearest SAMES
representative.
AC PARAMETERS
T = 0°C to + 70°C, V = 5V ± 5%. Load Cap<= 50pf
A
CC
AC PARAMETERS
Propagation delay of outputs synchronous to
CLKIN (i.e. 2MCLK, CLKDIV2, and
WD_INT) relative to CLKIN rising clock edge
Propagation delay of outputs synchronous
to 2MCLK (i.e. INTRFRQ, 8KFS, PCMFSC,
INTRCAD, PCM_OUT, A0..A13
Delay to float of PCM_OUT AFTER LAST BIT
OF TIME-SLOT OUTPUT
Delay to float of WD_INT after going inactive
D0..D7 setup to 2MCLK rising edge
D0..D7 hold after 2MCLK rising edge
SYM MIN TYP MAX UNITS
Pd8M 0 20 40
ns
Pd
0 20 40 ns
2M
Pf
0 30 60 ns
po
PfWD 0 30 60
ns
Sd 100
ns
D
HdD 0
ns
Absolute Maximum Ratings*
Parameters
Symbol
Min
Supply Voltage
Voltage on any I/O pin
Current on any I/O pin
Storage Temperature
Package Power Dissipation
VDD
-0.3
V /V
-0.3
I0
II/I0
-10
T
-55
SIG
PD
Max
Unit
7.0
V
V +0.3
V
DD
+10
mA
+125
°C
1000
mW
* Stress above those listed under "Absolute Maximum Ratings" may cause permanent damage
to the device. This a stress rating only. Functional operation of the device at these or any other
condition above those inidcated in the operational sections of this specification, is not implied.
Exposure to Absolute Maximum Ratings for extended periods may effect device reliability.
12
sames

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