74V1T70CTR Ver la hoja de datos (PDF) - STMicroelectronics

Número de pieza

componentes Descripción

Fabricante

74V1T70CTR

SINGLE BUFFER

STMicroelectronics 

74V1T70

DC SPECIFICATIONS

Test Condition

Value

Symbol

Parameter

VIH High Level Input

Voltage

VIL Low Level Input

Voltage

VOH High Level Output

Voltage

VOL Low Level Output

Voltage

II

ICC

ICC

Input Leakage

Current

Quiescent Supply

Current

Additional Worst

Case Supply

Current

VCC

(V)

4.5 to

5.5

4.5 to

5.5

4.5

4.5

4.5

4.5

0 to

5.5

IO=-50 µA

IO=-8 mA

IO=50 µA

IO=8 mA

VI = 5.5V or GND

5.5 VI = VCC or GND

One Input at 3.4V,

5.5 other input at VCC

or GND

TA = 25°C

-40 to 85°C -55 to 125°C Unit

Min. Typ. Max. Min. Max. Min. Max.

2

2

2

V

0.8

0.8

0.8 V

4.4 4.5

4.4

4.4

V

3.94

3.8

3.7

0.0 0.1

0.1

0.1 V

0.36

0.44

0.55

± 0.1

± 1.0

± 1.0 µA

1

10

20 µA

1.35

1.5

1.5 mA

AC ELECTRICAL CHARACTERISTICS (Input tr = tf = 3ns)

Test Condition

Value

Symbol

Parameter

VCC CL

(V) (pF)

tPLH Propagation Delay 5.0 (*) 15

tPHL Time

5.0 (*) 50

(*) Voltage range is 5.0V ± 0.5V

TA = 25°C

-40 to 85°C -55 to 125°C Unit

Min. Typ. Max. Min. Max. Min. Max.

3.6 6.0 1.0 7.0 1.0 8.0

ns

4.0 6.5 1.0 7.5 1.0 8.5

CAPACITIVE CHARACTERISTICS

Test Condition

Value

Symbol

Parameter

TA = 25°C

-40 to 85°C -55 to 125°C Unit

Min. Typ. Max. Min. Max. Min. Max.

CIN Input Capacitance

4 10

10

10 pF

CPD Power Dissipation

Capacitance

14

pF

(note 1)

1) CPD is defined as the value of the IC’s internal equivalent capacitance which is calculated from the operating current consumption without

load. (Refer to Test Circuit). Average operating current can be obtained by the following equation. ICC(opr) = CPD x VCC x fIN + ICC

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