5962R9582001QXC Ver la hoja de datos (PDF) - Intersil

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5962R9582001QXC

Radiation Hardened CMOS Static Clock Controller/Generator

Intersil 

Die Characteristics

DIE DIMENSIONS:

2770μm x 3130μm x 483μm ±25μm

INTERFACE MATERIALS:

Glassivation:

Type: SiO2

Thickness: 8kÅ ±1kÅ

Top Metallization:

Type: Al/Si

Thickness: 11kÅ ±2kÅ

Metallization Mask Layout

HS-82C85RH

Substrate:

Radiation Hardened Silicon Gate,

Dielectric Isolation

Backside Finish:

Silicon

ASSEMBLY RELATED INFORMATION:

Substrate Potential:

Unbiased (DI)

ADDITIONAL INFORMATION:

Worst Case Current Density:

1.6 x 104 A/cm2

HS-82C85RH

RDY1 (4)

READY (5)

RDY2 (6)

AEN2 (7)

CLK (8)

M

A

S

K

(20) EFI

(19) F/C

(18) OSC

(17) RES

(16) RESET

16

FN3044.3

April 20, 2007

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