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UT1750AR(2003) Ver la hoja de datos (PDF) - Aeroflex UTMC

Número de pieza
componentes Descripción
Fabricante
UT1750AR
(Rev.:2003)
UTMC
Aeroflex UTMC UTMC
UT1750AR Datasheet PDF : 55 Pages
First Prev 41 42 43 44 45 46 47 48 49 50 Next Last
ELECTRICAL CHARACTERISTICS
VDD = 5.0V±10%; -55°C < TC < +125°C
SYMBOL
PARAMETER
CONDITION
MINIMUM MAXIMUM UNIT
V
I
6
L
VIH6,7
IIN
VOL
VOH
IOZ
Low-level input voltage
OSC inputs
TTL inputs
High-level input voltage
OSC inputs
TTL inputs
Input leakage current
Inputs without resisters
Inputs with pull-down resistors
Inputs with pull-up resistors
VIN = V DD or VSS
VIN = V DD
VIN = V SS
Low-level output voltage
TTL outputs
OSC outputs
IOL = 3.2mA
IOL = 6.4mA Note 5
IOL = 100µA
High-level output voltage
TTL outputs
OSC outputs
IOH = -400µA
IOH = -800µA Note 5
IOH = -100µA
Three-state output leakage current VO = VDD or VSS
1.2
V
0.8
V
3.6
V
2.0
V
-10
10
µA
80
900
µA
-900
-80
µA
0.4
V
0.4
V
1.0
V
2.4
V
2.4
V
3.5
V
-10
+10
µA
-20 Note 5
+20 Note 5
µA
IOS1,2 Short-circuit output current
VDD = 5.5V, VO = 0V to VDD
-100
+100
mA
-200 Note 5
+200 Note 5
mA
CIN
Input capacitance
F = 1MHz @ 0V
10
pF
COUT Output capacitance
F = 1MHz @ 0V
15
pF
CIO
IDD1, 4
Bidirectional I/O capacitance
Average operating current
QIDD Quiescent current
F = 1MHz @ 0V
F = 12MHz, CL = 50pF
F = 16MHz, CL = 50p
Note 3
20
pF
50
mA
75
1
mA
Notes:
1. Supplied as a design limit but not guaranteed or tested.
2. Not more than one output may be shorted at a time for maximum duration of one second.
3. All inputs with internal pull-ups or pull-downs should be left open circuit, all other inputs tied low or high. TEST input pin asserted.
4. Includes current through input pull-ups. Instantaneous surge currents on the order of 1 ampere can occur during output switching. Voltage supply should be
adequately sized and decoupled to handle a large current surge.
5. Double buffer output pins (i.e., DS, R/WR, M/IO, OP/I, AS).
6.
Functional tests are conducted in accordance with MIL-STD-883
-50%, as specified herein, for TTL and CMOS compatible inputs.
with the
Devices
following input test
may be tested using
caonnydiintipountsv: oVltIHag=e
wViItHhi(nmtihne)
+ab2o0v%e ,sp-0e%ci;fiVedILra=nVgeIL,
(max)
but are
+0%,
guar-
anteed to V IH (min) and V IL (max).
7. Radiation-hardened technology shall have a VIH pre-irradiation of 2.2V.
41

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