TrenchStop® Series
IGW08T120
q
Figure A. Definition of switching times
Ï„1
r1
Tj (t)
p(t)
r1
Ï„2
r2
r2
Ï„n
rn
rn
TC
Figure D. Thermal equivalent
circuit
Figure B. Definition of switching losses
Power Semiconductors
11
Figure E. Dynamic test circuit
Leakage inductance Lσ =180nH
a nd Stray capacity Cσ =39pF.
Rev. 2.6 Nov. 09