DC CHARACTERISTICS
CMOS Compatible
Parameter
Description
Test Conditions
Min
Typ
Max
Unit
ILI
ILIT
ILR
ILO
ICC1
Input Load Current
A9 Input Load Current
RESET# Input Load Current
Output Leakage Current
VCC Active Read Current
(Notes 1, 2)
VIN = VSS to VCC,
VCC = VCC max
VCC = VCC max; A9 = 12.5 V
VCC = VCC max; RESET# = 12.5 V
VOUT = VSS to VCC,
VCC = VCC max
CE# = VIL, OE# = VIH
5 MHz
1 MHz
±1.0
µA
35
µA
35
µA
±1.0
µA
7
12
mA
2
4
ICC2
VCC Active Write Current
(Notes 2, 3, 5)
CE# = VIL, OE# = VIH
15
30
mA
ICC3
VCC Standby Current (Note 2) CE#, RESET# = VCC ± 0.3 V
ICC4
VCC Reset Current (Note 2)
RESET# = VSS ± 0.3 V
ICC5
Automatic Sleep Mode
(Notes 2, 4)
VIH = VCC ± 0.3 V;
VIL = VSS ± 0.3 V
VIL
Input Low Voltage
VIH
Input High Voltage
VID
Voltage for Autoselect and
Temporary Sector Unprotect
VCC = 3.3 V
0.2
5
µA
0.2
5
µA
0.2
5
µA
–0.5
0.7 x VCC
11.5
0.8
V
VCC + 0.3 V
12.5
V
VOL
VOH1
VOH2
VLKO
Output Low Voltage
Output High Voltage
Low VCC Lock-Out Voltage
(Note 5)
IOL = 4.0 mA, VCC = VCC min
IOH = –2.0 mA, VCC = VCC min
IOH = –100 µA, VCC = VCC min
0.85 VCC
VCC–0.4
2.3
0.45
V
V
2.5
V
Notes:
1. The ICC current listed is typically less than 2 mA/MHz, with OE# at VIH.
2. Maximum ICC specifications are tested with VCC = VCCmax.
3. ICC active while Embedded Erase or Embedded Program is in progress.
4. Automatic sleep mode enables the low power mode when addresses remain stable for tACC + 30 ns. Typical sleep mode
current is 200 nA.
5. Not 100% tested.
September 26, 2002
Am29LV001B
23