CXK591000YM-70LL Ver la hoja de datos (PDF) - Sony Semiconductor

Número de pieza

componentes Descripción

Fabricante

CXK591000YM-70LL

131,072-word ×9-bit High Speed CMOS Static RAM

Sony Semiconductor 

Data retention waveform

• Low supply voltage data retention waveform (1) (CE1 control)

tCDRS

Data retention mode

tR

VCC

4.5V

2.2V

VDR

CE1

GND

CE1 ≥ VCC – 0.2V

• Low supply voltage data retention waveform (2) (CE2 control)

VCC

4.5V

CE2

VDR

0.4V

GND

Data retention mode

tCDRS

tR

CE2 ≤ 0.2V

CXK591000TM/YM/M

Data Retention Characteristics

(Ta = 0 to +70°C)

Item

Symbol

Test conditions

Min. Typ. Max. Unit

Data retention

voltage

VDR

∗1

2.0

—

5.5 V

Data retention

current

ICCDR1 VCC = 3.0V∗1

0 to +70°C —

0 to +40°C —

+25°C

—

ICCDR2 VCC = 2.0 to 5.5V∗1

—

—

—

0.5

0.8∗2

14

3 µA

1.4

24 µA

Data retention

setup time

tCDRS

Chip disable to data retention

mode

0

—

— ns

Recovery time

tR

5

—

— ms

∗1 CE1 ≥ Vcc – 0.2V, CE2 ≥ Vcc – 0.2V (CE1 control) or CE2 ≤ 0.2V (CE2 control)

∗2 VCC = 5V, Ta = 25°C

–9–

Share Link: